ellipsometer / multi-wavelength

The PHE101M is a multi-wavelegnth ellipsometer from Angstrom Advanced that is ideal for measuring the refractive index and thickness of single and multi-layer films at several wavelengths. It has a wide variable angle at 10-90? which is adjustable in steps of 5?s, with an accuracy of 0.01?. It is offered in various wavelengths from UV, VIS or NIR range can be chosen. The standard wavelength of the PHE101M ellipsometer is HeNe laser at 632.8nm. The wavelength can be selected by a combination of 543nm, 594nm, 612nm, 635nm to 1164 nm. It is also offered in Infrared sources at 0.83, 1.31 and 1.52 mm.